Applied Materials’ New eBeam Metrology System Paves the Way to High-NA EUV Lithography
Go back to Applied Materials’ New eBeam Metrology System Paves the Way to High-NA EUV Lithography| Applied Materials Inc (NASDAQ: AMAT) | Delayed: 416.28 +0.90 (0.22%) | |||||
|---|---|---|---|---|---|---|
| Previous Close | $415.38 | 52 Week High | $31.07 | |||
| Open | $427.58 | 52 Week Low | $15.44 | |||
| Day High | $428.54 | P/E | 1,095.47 | |||
| Day Low | $414.10 | EPS | $0.38 | |||
| Volume | 1,955,135 | |||||
